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1. International Test Conference 2001 : proceedings, October 30 - November 1, 2001, Baltimore Convention Center, Baltimore, MD, USA
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2001  xiv, 1201 p. ; 29 cm
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図書
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2. International Test Conference 2002 : proceedings, October 7-10, 2002, Baltimore Convention Center, Baltimore, MD, USA
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2002  xvi, 1250 p. ; 29 cm
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図書
図書
3. Proceedings : International Test Conference 2000, [October 3-5, 2000, New Atlantic City Convention Center, Atlantic City, NJ, USA] (: soft ; : case ; : microfiche)
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2000  xiv, 1158 p. ; 29 cm
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図書
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4. Proceedings 14th Asian Test Symposium, Calcutta, India, December 18-21, 2005
Asian Test Symposium ; IEEE Computer Society ; IEEE Computer Society. Test Technology Technical Council
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2005  xxxv, 476 p. ; 28 cm
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図書
5. Proceedings, 4th International Workshop on Microprocessor Test and Verification : common challenges and solutions : MTV 2003, Hyatt Town Lake Hotel, Austin, Texas, May 29-30, 2003
[edited by Magdy S. Abadir and Li-C. Wang] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC)
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2003  xi, 125 p. ; 28 cm
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目次情報: 続きを見る
Preface
Workshop Committees
TTTC: Test Technology Technical Council
Functional Test Generation / Session A：
Deep Trans--A Model-Based Approach to Functional Verification of Address Translation Mechanisms / A Adir ; R. Emek ; Y. Katz ; A. Koyfman
Modeling IP Responses in Testcase Generation for Systems-on-Chip Verification / M. Bose ; M. Nodine ; W. Jurasz, Jr. ; V. Zavadsky ; A. Chodavadia ; L. Nunes
Definition of a Systematic Method for the Generation of Software Test Programs Allowing the Functional Verification of System on Chip (SoC) / F. Hunsinger ; S. Francois ; A. Jerraya
Special Session, Research at University of Texas and Texas A&M / Session B：
Testing the Path Delay Faults of ISCAS85 Circuit c6288 / W. Qiu ; D. Walker
Keynote Speech / M. Gandhi, Sr.
Issues in Microprocessor Test and Verification / Session C：
Comparison of Verification Methodologies for Datapath Testing / V. Iyer
A Methodology for Validating Manufacturing Test Vector Suites for Custom Designed Scan-Based Circuits / J. Bhadra ; N. Krishnamurthy ; M. Abadir
Utilizing Various ADL Facets for Instruction Level CPU Test / E. Safi ; Z. Karimi ; M. Abbaspour ; Z. Navabi
Debug and Diagnosis / Session E：
Automatic Detection of Logic Bugs in Hardware Designs / A. Klaiber ; S. Chau
Extraction Error Analysis, Diagnosis and Correction in Custom-Made High-Performance Designs / Y.-S. Yang ; J. Liu ; P. Thadikaran ; A. Veneris
Fault Diagnosis and Logic Debugging Using Boolean Satisfiability
SAT and ATPG / Session F：
Heuristic Backtracking Algorithms for SAT / A. Bhalla ; I. Lynce ; J. de Sousa ; J. Marques-Silva
Tuning the VSIDS Decision Heuristic for Bounded Model Checking / O. Shacham ; E. Zarpas
Embedded System Validation / Session G：
A Methodology for Validation of Microprocessors Using Equivalence Checking / P. Mishra ; N. Dutt
A SystemC-Based Framework for Properties Incompleteness Evaluation / A. Fin ; F. Fummi ; M. Poncino ; G. Pravadelli
A Robust and Scalable Technique for the Constraints Solving Problem in High-Level Verification / M. Iyer
Simulation Techniques / Session H：
Systematic Abstractions of Microprocessor RTL Models to Enhance Simulation Efficiency / D. Bhaduri ; M. Chandra ; H. Patel ; S. Sharad ; S. Suhaib
Case Study / Session I：
Energy Awareness through Software Optimisation as a Performance Estimate Case Study of the MC68HC908GP32 Microcontroller / J. Oliver ; O. Mocanu ; C. Ferrer
High-Level Verification / Session K：
A Deterministic Globally Asynchronous Locally Synchronous Microprocessor Architecture / M. Heath ; I. Harris
Author Index
Preface
Workshop Committees
TTTC: Test Technology Technical Council
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