X-Ray diffraction procedures for polycrystalline and amorphous materials

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X-Ray diffraction procedures for polycrystalline and amorphous materials / Harold P. Klug, Leroy E. Alexander

版:

2nd ed

資料種別:

図書

出版情報:

New York : Wiley, c1974

形態:

xxv, 966 p. ; 24 cm

著者名:

ISBN:

9780471493693 [0471493694]

書誌ID:

BA00281854

子書誌情報

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X-Ray diffraction procedures for polycrystalline and amorphous materials
Harold P. Klug, Leroy Elbert Alexander , Wiley , c1954

書誌詳細

注記:

"A Wiley-Interscience publication."
Includes bibliographical references and index

主題:

X-rays--Diffraction

言語:

英語

目次情報:

Elementary Crystallography / 1：

The Crystalline State / 1-1：

Crystalline and Amorphous Solids / 1-1.1：

Definition of a Crystal / 1-1.2：

Characteristics of the Crystalline and Vitreous States / 1-1.3：

Crystal Geometry / 1-2：

External Form and Habit of Crystals / 1-2.1：

Constancy of Interfacial Angles / 1-2.2：

Symmetry Elements of Crystals / 1-2.3：

Pseudosymmetry, 13 / 1-2.4：

Crystallographic Axes / 1-2.5：

Axial Ratios / 1-2.6：

The Six Crystal Symmetry Systems / 1-2.7：

Miller Indices / 1-2.8：

The Law of Rational Indices / 1-2.9：

Crystal Forms / 1-2.10：

Composite Crystals and Twinning / 1-2.11：

Equation for the Plane (hkl) / 1-2.12：

Zones and Zone Relationships / 1-2.13：

Space Lattices / 1-3：

Historical Introduction / 1-3.1：

Definition / 1-3.2：

The Unit Ceil / 1-3.3：

The 14 Bravais Lattices / 1-3.4：

Some Crystallographic Implications of Space Lattices / 1-3.5：

Distance between Neighboring Lattice Planes in the Series (hkl) / 1-3.6：

The Reciprocal Lattice / 1-3.7：

Point Groups and Space Groups / 1-4：

The Point Group or Crystal Symmetry Class / 1-4.1：

The Space Group / 1-4.2：

General References

Specific References

The Production and Properties of X-rays / 2：

X-Ray Safety and Protection / 2-1：

The Production of X-Rays / 2-2：

The Origin of X-Rays / 2-2.1：

X-Ray Tubes / 2-2.2：

Gas tubes / A：

Hot-cathode tubes / B：

Modern diffraction tube design / C：

Cold-cathode diffraction tubes / D：

High-intensity diffraction tubes / E：

Microfocus diffraction tubes / F：

Power Equipment for the Production of X-rays / 2-2.3：

Commercial X-ray Generators for Diffraction / 2-2.4：

Isotopic X-ray Sources / 2-2.5：

Properties of X-Rays and their Measurement / 2-3：

The X-ray Spectrum of an Element / 2-3.1：

The continuous x-ray spectrum

The characteristic x-ray spectrum

The Precise Determination of X-ray Wavelengths / 2-3.2：

Absorption of X-rays / 2-3.3：

Secondary Fluorescent and Scattered X-rays / 2-3.4：

Refraction of X-rays / 2-3.5：

Monochromatization of X-radiation / 2-3.6：

Single filter technique

Balanced-filter technique

Crystal monochromator techniques

Graphite monochromators

The Photographic Effects of X-rays / 2-3.7：

Fundamental Principles of X-ray Diffraction / 3：

Kinematical and Dynamical Diffraction Theory / 3-1：

The Geometry of Diffraction / 3-2：

Scattering of X-rays by Electrons and Atoms / 3-2.1：

Scattering by a Regularly Spaced Row of Atoms / 3-2.2：

Conditions for Diffraction by a Linear Lattice of Atoms / 3-2.3：

Diffraction by a Simple Cubic Lattice / 3-2.4：

Proof that the "Diffracting Plane" is a Lattice Plane / 3-2.5：

The Bragg Equation / 3-2.6：

Derivation of the Bragg Equation from the "Reflection" Analogy / 3-2.7：

The Geometrical Picture of Diffraction in Reciprocal Space / 3-2.8：

The Intensity of Diffraction / 3-3：

Perfect and Imperfect Crystals / 3-3.1：

Primary and Secondary Extinction / 3-3.2：

Relative and Absolute Intensities / 3-3.3：

Factors Affecting the Diffraction Intensities / 3-3.4：

The polarization factor

The Lorentz and "velocity" factors

The temperature factor

The atomic scattering factor

The structure factor

The multiplicity factor

The absorption factor / G：

Expressions for the Relative Intensity of Diffraction by the Various Techniques / 3-3.5：

Lattice-Centering and Space-Group Extinctions / 3-3.6：

Photographic Powder Techniques / 4：

The Debye-Scherrer Method / 4-1：

Introduction / 4-1.1：

Camera Design / 4-1.2：

General geometry

Details of camera construction

Camera support and alignment

Preparation of the Powder / 4-1.3：

Mounting the Powder / 4-1.4：

Making the Exposure / 4-1.5：

Processing the Film / 4-1.6：

Parafocusing Methods / 4-2：

Monochromatic-Pinhole Techniques / 4-3：

Forward-Reflection Method / 4-3.1：

Back-Reflection Method / 4-3.2：

Microcameras and Microbeam Techniques / 4-4：

High-Temperature Techniques / 4-5：

Low-Temperature Techniques / 4-6：

High-Pressure Techniques / 4-7：

Diffractometric Powder Technique

Geometry of the Powder Diffractometer / 5-1：

General Features / 5-1.1：

Details of the Optical Arrangement / 5-1.2：

The Seemann-Bohlin Diffractometer / 5-1.3：

Alignment and Angular Calibration of the Diffractometer / 5-1.4：

Operations appropriately performed in advance by the manufacturer

Further internal alignment of the goniometer

Alignment of the goniometer with respect to the x-ray tube

Calibration of the O? 2Theta; position

Calibration of angular registration between 0 and 180? 2Theta;

Profiles and positions of diffraction maxima / 5-2：

Convolution Synthesis of Line Profiles / 5-2.1：

X-ray source, g I

Flat specimen surface, g II

Axial divergence, g III

Specimen transparency, g IV

Receiving slit, g v

Comparison of calculated and experimental line profiles

Displacement and Breadth of Diffraction Maxima / 5-2.2：

Line position

Line breadth

The practical determination of the centroid and variance

Accurate Determination of Interplanar (d) Spacings / 5-2.3：

"Routine" Determination of Interplanar (d) Spacings / 5-2.4：

Electrical Characteristics of the Diffractometer / 5-3：

General Arrangement of Components / 5-3.1：

Radiation Detectors (Quantum Counters) / 5-3.2：

Gas-ionization counters

Geiger-Muller counters

Proportional counters

Scintillation counters

Solid-state (energy-dispersive) detectors

Nonlinearity of Detector Response / 5-3.3：

Monochromatizing Techniques / 5-3.4：

Pulse-height discrimination and analysis

Ross balanced filters

Crystal monochromators

Choice of Experimental Conditions and Procedures / 5-4：

Statistical Accuracy of Counter Measurements / 5-4.1：

The Specimen / 5-4.2：

Preparation of powders

Rotation of the specimen

Preferred orientation and the specimen mount

High-temperature techniques

Low-temperature techniques

Other special specimen techniques

Transmission Techniques / 5-4.3：

Continuous-Scan Techniques / 5-4.4：

Step-Scan Techniques and Automation / 5-4.5：

The Interpretation of Powder Diffraction Data / 6：

The Viewing and Precision Measurement of Powder Photographs / 6-1：

Determination of Interplanar (d) Spacings / 6-2：

Debye-Scherrer Patterns / 6-2.1：

Monochromatic-Pinhole (Flat-Film) Patterns / 6-2.2：

Indexing Cubic Powder Patterns / 6-3：

Reciprocal-Lattice Picture of Diffraction by a Cubic Powder / 6-3.1：

Indexing a Cubic Pattern by sin 2 Theta Ratios / 6-3.2：

Determination of the Unit-Cell Dimension a / 6-3.3：

Indexing a Cubic Pattern When a Is Known / 6-3.4：

Determination of Lattice Type / 6-4：

Indexing Noncubic Powder Patterns / 6-5：

Indexing Noncubic Patterns When the Unit-Cell Dimensions are Known / 6-5.1：

Graphical Methods of Indexing / 6-5.2：

Analytical Methods of Indexing: Tetragonal, Hexagonal, and Orthorhombic Patterns / 6-5.3：

Analytical Methods of Indexing: Monoclinic and Triclinic Patterns / 6-5.4：

Automated Computing Procedures for Indexing Powder Patterns / 6-6：

Programs for Patterns of Orthorhombic and Higher Symmetry / 6-6.1：

Programs for Patterns of Low Symmetry / 6-6.2：

The Measurement of Intensities from Photographic Blackening / 6-7：

Preparation of a Graded Intensity Scale / 6-7.1：

Visual Estimation of Intensities / 6-7.3：

Photometer Techniques / 6-7.4：

The Measurement of Intensities with the X-Ray Diffractometer / 6-8：

Putting Intensities on an Absolute Scale / 6-9：

Special Scattering and Diffraction Effects / 6-10：

Background Effects / 6-10.1：

Background due to lattice imperfections

Background due to general radiation

Absorption discontinuities

Air scatter

Secondary fluorescence radiation

Reflections of Unusual Char / 6-10.2：

Elementary Crystallography / 1：

The Crystalline State / 1-1：

Crystalline and Amorphous Solids / 1-1.1：

Definition of a Crystal / 1-1.2：

Characteristics of the Crystalline and Vitreous States / 1-1.3：

Crystal Geometry / 1-2：

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