MOEMS display and imaging systems : 28-29 January 2003, San Jose, California, USA | 東京工業大学附属図書館蔵書検索

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MOEMS display and imaging systems : 28-29 January 2003, San Jose, California, USA / Hakan Urey, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, SolidState Technology, [and] Sandia National Laboratories (USA)

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE, c2003

形態:

xlii, 306 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4985 <BA0022700X>

著者名:

ISBN:

9780819447852 [0819447854]

書誌ID:

BC08845302

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and index
主題:	Imaging systems--Congresses; Microelectromechanical systems--Congresses; Optics, Adaptive--Congresses; Scanning systems--Congresses
言語:	英語

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