2005 IEEE International Test Conference (ITC), 8-10 Novermber, 2005, Austin, TX | 東京工業大学附属図書館蔵書検索

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2005 IEEE International Test Conference (ITC), 8-10 Novermber, 2005, Austin, TX / International Test Conference ; IEEE Computer Society. Test Technology Technical Council ; Institute of Electrical and Electronics Engineers

資料種別:

図書

出版情報:

[Piscataway] : Institute of Electrical and Electronics Engineers, c2005

形態:

2 v. ; 28 cm

著者名:

ISBN:

9780780390386 [0780390385] (: [set])

書誌ID:

BA76528499

子書誌情報

フルテキスト

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書誌詳細

ISSN:	10893539
注記:	IEEE Catalog Number: 05CH37661 Includes bibliographical references and index
言語:	英語

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